Patch-clamp is used to study all sorts of ionic channels and their regulations with measuring pA current of cell ionic channel, but the fast capacitance (C-fast) compensation and slow capacitance (C-slow) compensation transient currents are caused by measuring objects and measuring instruments themselves which will change the properties of action potentials. The present paper firstly discusses the C-Fast transient currents affecting membrane capacitance and membrane potential, and then draws a conclusion that the changes of membrane potential affect the properties of action potential through analyzing the changes of membrane potential in H-H model. Based on this conclusion, we discuss the influence mechanisms mainly through the analysis of traditional C-fast compensation errors, and focus discussion on the shape of electrode capacitance affecting C-fast. This method can not only improve the compensation speed greatly, but also improve the compensation precision from the electrode shape as much as possible.
